Robin Baughman, VTC, and Peter Kirsch, Kaplan Kirsch & Rockwell, Named to the 2018 ACC Board of Directors
Alexandria, VA – The Airport Consultants Council (ACC) is pleased to welcome Robin Baughman, President and CFO, VTC, and Peter Kirsch, Partner, Kaplan Kirsch & Rockwell, as new members of the ACC Board of Directors. They will be filling two vacancies on the board left by the departure of Todd Knuckey, Mead & Hunt; and Manik Arora, Arora Engineers.
“ACC appreciates the valuable insights and contributions that Todd Knuckey and Manik Arora provided during their tenure on the Board of Directors,” said Mary Ellen Eagan, President and CEO of HMMH and ACC Board Chair. “In filling these vacancies, Robin Baughman and Peter Kirsch will provide unique and important perspectives, particularly as ACC seeks to update its Strategic Plan. We look forward to having them participate in the effort to chart ACC’s future direction and focus areas.”
With a career history of leading design and construction projects and national programs for transportation security systems integration and operational testing, Robin Baughman is committed to delivering cost-effective and flexible solutions to her clients. She serves as Principal-in-Charge for several of the largest contracts held by the firm and works with other members of the VTC Executive Team to make sure projects are carried out to a high standard of excellence.
Peter Kirsch’s practice focuses on regulation and development of infrastructure and other public-sector projects. Peter represents clients ranging from local governments to the private sector and public interest groups in negotiations and litigation over land use entitlements, the environmental impacts of infrastructure projects, and compliance with federal transportation law and regulations. He litigates cases before administrative agencies, numerous state and federal trial and appellate courts, and the U.S. Supreme Court. He represents airport sponsors and local governments before Congress and federal administrative agencies.